SPRING-L <100 nm SThM probes for Dimension SPMs

SThM probes for Dimension SPMs

of Calibration

8mm in length

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features

Microfabricated platinum iridium coated silicon probes with single cantilever ~125 microns long

SPRING-L <100 nm SThM probes for Dimension SPMsReplacement scanner springs for AS 130 and AS 200 type scanners DESCRIPTION TIP SPECIFICATIONS Replacement scanner springs for AS 130 and AS 200 type scanners, MultiMode SPM. These springs supply tension to the AFM optical head, scanner, and base for mechanical stability. These springs supply tension to the AFM optical head, scanner, and base for mechanical stability.